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HARVARD Citation
Huang, Q. et al. (2017). A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates. Composite structures. pp. 613-624. [Online].
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Huang, Q. et al. (2017). A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates. Composite structures. pp. 613-624. [Online].