Cite
APA Citation
Brinciotti, E., Gramse, G., Hommel, S., Schweinboeck, T., Altes, A., Fenner, M. A., Smoliner, J., Kasper, M., Badino, G., Tuca, S., & Kienberger, F. (2015). probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy. Nanoscale, 7(35), 14715–14722. http://access.bl.uk/ark:/81055/vdc_100073838856.0x000001