Cite
HARVARD Citation
Brinciotti, E. et al. (2015). Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy. Nanoscale. 7 (35), pp. 14715-14722. [Online].
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Brinciotti, E. et al. (2015). Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy. Nanoscale. 7 (35), pp. 14715-14722. [Online].