A compact abstraction of manufacturing nodes in a supply network. (1st October 2007)

• Record Type: Journal Article
• Authors: Duarte, Brett M.; Fowler, John W.; Knutson, Kraig; Gel, Esma; , Dan Shunk
• Is Part Of: International journal of simulation and process modelling. Volume 3:Number 3(2007)
• Page Start: 115
• Page End: 126
• Publication Date: 2007-10-01
• Subjects: supply chain management -- SCM -- discrete event simulation -- DES -- parameterisation -- Markov chain -- speed -- accuracy -- manufacturing nodes -- semiconductor supply networks -- modelling -- wafer fabrication -- cycle time -- throughput; Management -- Computer simulation -- Periodicals; Mathematical models -- Periodicals; Operations research -- Periodicals; Simulation methods -- Periodicals; 003.05
• Languages: English
• ISSNs: 1740-2123

Abstract

This paper presents the abstraction process to support a modular approach for simulating semiconductor supply networks by modelling each node in the network as a 'Functional Block'. In particular, a functional block to represent wafer fabrication facilities is developed, which strikes a suitable balance between a high level abstraction and modelling the detailed complexities of a manufacturing facility. We demonstrate that the model is able to produce performance estimates (average Cycle Time (CT) and Throughput (TH)) that resemble the behaviour of real-life systems and are accurate with respect to comparisons with a detailed Discrete Event Simulation (DES) model.