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APA Citation
Liu, J., Liang, H., Liu, Y., Xia, X., Huang, H., Tao, P., Sandhu, Q. A., Shen, R., Luo, Y., & Du, G. (2017). strain and microstructures of GaN epilayers with thick InGaN interlayer grown by MOCVD. Materials science in semiconductor processing, 60, 66–70. http://access.bl.uk/ark:/81055/vdc_100040375751.0x000023