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HARVARD Citation
Liu, J. et al. (2017). Strain and microstructures of GaN epilayers with thick InGaN interlayer grown by MOCVD. Materials science in semiconductor processing. pp. 66-70. [Online].
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Liu, J. et al. (2017). Strain and microstructures of GaN epilayers with thick InGaN interlayer grown by MOCVD. Materials science in semiconductor processing. pp. 66-70. [Online].