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APA Citation
Zwiebler, M., Hamann-Borrero, J. E., Vafaee, M., Komissinskiy, P., Macke, S., Sutarto, R., He, F., Büchner, B., Sawatzky, G. A., Alff, L., & Geck, J. (n.d.). electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity. New journal of physics, 17, . http://access.bl.uk/ark:/81055/vdc_100066495818.0x000053