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Zangl, H., & Mühlbacher-Karrer, S. (2015). artefact reduction in fast Bayesian inversion in electrical tomography. Compel, 34(5), 1381–1391. http://access.bl.uk/ark:/81055/vdc_100070789935.0x000042
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Zangl, H., & Mühlbacher-Karrer, S. (2015). artefact reduction in fast Bayesian inversion in electrical tomography. Compel, 34(5), 1381–1391. http://access.bl.uk/ark:/81055/vdc_100070789935.0x000042