Cite
MLA Citation
A. Belmonte et al.. “Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 μA).” Solid-state electronics, vol. 125, 2016, pp. 189–197. http://access.bl.uk/ark:/81055/vdc_100070751932.0x000055