Cite
APA Citation
Moreno‐Zarate, P., Gonzalez, A., Funke, S., Días, A., Sotillo, B., del Hoyo, J., Garcia‐Pardo, M., Serna, R., Fernandez, P., & Solis, J. (2018). imaging Ellipsometry Determination of the Refractive Index Contrast and Dispersion of Channel Waveguides Inscribed by fs‐Laser Induced Ion‐Migration. Physica status solidi, 215(19), n/a. http://access.bl.uk/ark:/81055/vdc_100070085298.0x000008