Evaluation of the corrosion performance of Cu–Al intermetallic compounds and the effect of Pd addition. (January 2016)
- Record Type:
- Journal Article
- Title:
- Evaluation of the corrosion performance of Cu–Al intermetallic compounds and the effect of Pd addition. (January 2016)
- Main Title:
- Evaluation of the corrosion performance of Cu–Al intermetallic compounds and the effect of Pd addition
- Authors:
- Lim, Adeline B.Y.
Neo, Wei Jian
Yauw, Oranna
Chylak, Bob
Gan, Chee Lip
Chen, Zhong - Abstract:
- Abstract: Copper wire has become a mainstream bonding material in fine-pitch applications due to the rising cost of gold wire. In recent years, palladium-coated copper (Pd–Cu) wire is being increasingly used to overcome some constraints posed by pure Cu wire. During wire bonding with aluminum bond pads, different intermetallic compound (IMC) phases that have been identified at the bond interface are typically CuAl2, CuAl and Cu9 Al4 . However, the corrosion susceptibility of these IMCs has not been investigated. This paper compares the electrical impedance and corrosion performance of the three types of Cu–Al IMCs in an acidic chloride medium by employing electrochemical impedance spectroscopy (EIS) and potentiodynamic polarization. The analysis of the potentiodynamic polarization results was performed using Tafel extrapolation. A comparison was made with pure Cu and Al. The effect of Pd alloy on the IMC corrosion performance has also been studied. Among the three Cu–Al IMCs, Cu9 Al4 was observed to have the largest corrosion rate followed by CuAl2 and CuAl. For the metals, Cu was observed to have the lowest corrosion rate and Al is the most easily corroded. The addition of Pd of up to 10 wt.% replacement of the Cu in the alloys slightly improves the corrosion resistance of the metals and IMCs. Highlights: Corrosion performance of Cu, Al and Cu–Al IMCs in a chloride medium was studied. Effect of palladium addition on these corrosion properties was also investigated.Abstract: Copper wire has become a mainstream bonding material in fine-pitch applications due to the rising cost of gold wire. In recent years, palladium-coated copper (Pd–Cu) wire is being increasingly used to overcome some constraints posed by pure Cu wire. During wire bonding with aluminum bond pads, different intermetallic compound (IMC) phases that have been identified at the bond interface are typically CuAl2, CuAl and Cu9 Al4 . However, the corrosion susceptibility of these IMCs has not been investigated. This paper compares the electrical impedance and corrosion performance of the three types of Cu–Al IMCs in an acidic chloride medium by employing electrochemical impedance spectroscopy (EIS) and potentiodynamic polarization. The analysis of the potentiodynamic polarization results was performed using Tafel extrapolation. A comparison was made with pure Cu and Al. The effect of Pd alloy on the IMC corrosion performance has also been studied. Among the three Cu–Al IMCs, Cu9 Al4 was observed to have the largest corrosion rate followed by CuAl2 and CuAl. For the metals, Cu was observed to have the lowest corrosion rate and Al is the most easily corroded. The addition of Pd of up to 10 wt.% replacement of the Cu in the alloys slightly improves the corrosion resistance of the metals and IMCs. Highlights: Corrosion performance of Cu, Al and Cu–Al IMCs in a chloride medium was studied. Effect of palladium addition on these corrosion properties was also investigated. Corrosion resistance of the metals and IMCs improved slightly with Pd addition. Cu9 Al4 has the highest corrosion rate among the IMCs. … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 56(2016)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 56(2016)
- Issue Display:
- Volume 56, Issue 2016 (2016)
- Year:
- 2016
- Volume:
- 56
- Issue:
- 2016
- Issue Sort Value:
- 2016-0056-2016-0000
- Page Start:
- 155
- Page End:
- 161
- Publication Date:
- 2016-01
- Subjects:
- Palladium -- Cu–Al intermetallic compounds -- Copper wire bonding -- EIS -- Tafel
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2015.10.012 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 7896.xml