Cite
HARVARD Citation
Hur, J. et al. (2015). Dislocation scatterings in p-type Si1−xGex under weak electric field. Nanotechnology. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Hur, J. et al. (2015). Dislocation scatterings in p-type Si1−xGex under weak electric field. Nanotechnology. p. . [Online].