Cite
MLA Citation
Qing Lin et al.. “Hydrogen-induced program threshold voltage degradation analysis in SONOS wafer.” Solid-state electronics, vol. 116, 2016, pp. 60–64. http://access.bl.uk/ark:/81055/vdc_100069070837.0x00004e
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Qing Lin et al.. “Hydrogen-induced program threshold voltage degradation analysis in SONOS wafer.” Solid-state electronics, vol. 116, 2016, pp. 60–64. http://access.bl.uk/ark:/81055/vdc_100069070837.0x00004e