Cite
MLA Citation
A. Bravaix et al.. “Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.” Microelectronics and reliability, vol. 64, 2016, pp. 163–167. http://access.bl.uk/ark:/81055/vdc_100041024841.0x000045
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A. Bravaix et al.. “Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.” Microelectronics and reliability, vol. 64, 2016, pp. 163–167. http://access.bl.uk/ark:/81055/vdc_100041024841.0x000045