Cite
APA Citation
Pilia, R., Bascoul, G., Sanchez, K., Mura, G., & Infante, F. (2016). single Event Transient acquisition and mapping for space device Characterization. Microelectronics and reliability, 64, 73–78. http://access.bl.uk/ark:/81055/vdc_100041024841.0x000042