Magnetic field and current density imaging using off-line lock-in analysis. (September 2016)

• Record Type: Journal Article
• Authors: Kögel, M.; Altmann, F.; Tismer, S.; Brand, S.
• Is Part Of: Microelectronics and reliability. Volume 64(2016)
• Page Start: 346
• Page End: 351
• Publication Date: 2016-09
• Subjects: Magnetic current imaging -- Magnetoresistive sensors -- Current density distribution -- Magnetic current microscopy -- MCI -- Lock-in analysis; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2016.07.083
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: In the current paper the application of a custom developed 2-dimenional scanning magnetic field microscope based on tunnel-magnetoresistive sensors and subsequent qualitative and quantitative analysis is described. To improve sensitivity and to enable the detection and evaluation of phase deviations, an off-line lock-in approach was employed by driving the samples under test with an injected current at a fixed signal frequency. Amplitude and phase evaluation was based on simultaneous acquisition of the reference and the measurement signal obtained from the magnetic field sensor. This off-line lock-in approach enables not just the detection but also the estimation of changes in signal phase caused by capacitive, inductive or ohmic coupling of the induced currents. Furthermore assessed magnetic fields were converted into the current density by solving the inverse magnetic problem and post processing of the acquired signals. For verification of the developed set-up the current density distribution was computed from experimentally acquired magnetic fields for a two-wire test structure. In addition quantitative values of the current density were derived for a calibration pattern containing defined structures. Finally, to evaluate the practical relevance a power MOSFET with unknown defect was analysed and an area of unexpectedly increased magnetic field intensity was observed. Highlights: Application of a custom developed 2-dimensional scanning magnetic field microscope based on tunnel-magnetoresistive sensors Increasing the signal to noise ratio of the sensor was necessary to improve current sensitivity Driving the samples under test with an injected current at a fixed signal frequency enables lock-in approach For off-line lock-in analysis the reference signal and the sensor signal were acquired simultaneously Offline lock-in analysis allows evaluation of phase deviations and give access to ohmic, capactive or inductive coupling