On the prediction of radiation-induced SETs in flash-based FPGAs. (September 2016)

• Record Type: Journal Article
• Authors: Azimi, S.; Du, B.; Sterpone, L.
• Is Part Of: Microelectronics and reliability. Volume 64(2016)
• Page Start: 230
• Page End: 234
• Publication Date: 2016-09
• Subjects: Radiation sensitivity -- Single Event Transients -- Prediction -- Fault Tolerance -- Flash-based FPGAs; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2016.07.106
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) phenomena within the silicon structure of Flash-based FPGA devices. The method is based on a MonteCarlo analysis, which allows to calculate the effective duration and amplitude of the SET once generated by the radiation strike. The method allows to effectively characterize the sensitivity of a circuit against the transient effect phenomenon. Experimental results provide a comparison between different radiation tests data, performed with different Linear Energy Transfer (LET) and the respective sensitiveness of SETs.