Cite
MLA Citation
Canh V. Le. “Yield-stress based error indicator for adaptive quasi-static yield design of structures.” Computers & structures, vol. 171, 2016, pp. 1–8. http://access.bl.uk/ark:/81055/vdc_100041003638.0x00003a
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Canh V. Le. “Yield-stress based error indicator for adaptive quasi-static yield design of structures.” Computers & structures, vol. 171, 2016, pp. 1–8. http://access.bl.uk/ark:/81055/vdc_100041003638.0x00003a