Cite
HARVARD Citation
Le, C. (2016). Yield-stress based error indicator for adaptive quasi-static yield design of structures. Computers & structures. pp. 1-8. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Le, C. (2016). Yield-stress based error indicator for adaptive quasi-static yield design of structures. Computers & structures. pp. 1-8. [Online].