Cite
APA Citation
Zhu, Y., Katz-Boon, H., Zheng, C., Walsh, M., Dwyer, C., Bourgeois, L., Withers, R., & Etheridge, J. (n.d.). maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials. Microscopy and microanalysis, 21, 2415–2416. http://access.bl.uk/ark:/81055/vdc_100040771096.0x00000a