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APA Citation
Jones, L., MacArthur, K. E., Aarons, J., Skylaris, C., Sarwar, M., Ozkaya, D., & Nellist, P. D. (n.d.). towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design. Microscopy and microanalysis, 21, 2197–2198. http://access.bl.uk/ark:/81055/vdc_100040771068.0x000054