Cite
MLA Citation
C. Gatel et al.. “Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device.” Microscopy and microanalysis, vol. 21, n.d., pp. 2147–2148. http://access.bl.uk/ark:/81055/vdc_100040771068.0x000005