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APA Citation
Howe, J., Hoyle, D., Ueda, K., Dogel, S., Hosseinkhannazer, H., Reynolds, M., Veillette, R., Trudeau, M. L., & Joy, D. (n.d.). secondary Electron Yield at High Voltages up to 300 keV. Microscopy and microanalysis, 21, 1705–1706. http://access.bl.uk/ark:/81055/vdc_100040771259.0x000060