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APA Citation
Huang, J., Loeffler, M., Muehle, U., Moeller, W., Mulders, H., Kwakman, L., & Zschech, E. (n.d.). a Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation. Microscopy and microanalysis, 21, 1839–1840. http://access.bl.uk/ark:/81055/vdc_100040771259.0x000048