Cite
APA Citation
Howe, J., Hashimoto, Y., Wang, X., Vara, M., Hoyle, D., Schamp, T., Xia, Y., & Joy, D. (n.d.). detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging. Microscopy and microanalysis, 21, 1265–1266. http://access.bl.uk/ark:/81055/vdc_100040771215.0x00001c