Cite
MLA Citation
Deying Xia et al.. “Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS).” Microscopy and microanalysis, vol. 21, n.d., pp. 1165–1166. http://access.bl.uk/ark:/81055/vdc_100040771179.0x000040