Cite
MLA Citation
A. Valery et al.. “Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction.” Microscopy and microanalysis, vol. 21, n.d., pp. 1243–1244. http://access.bl.uk/ark:/81055/vdc_100040771179.0x000037