Cite
APA Citation
Estivill, R., Chevalier, P., Lorut, F., Juhel, M., Clement, L., Servanton, G., Avenier, G., Grenier, A., & Blavette, D. (n.d.). a Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS. Microscopy and microanalysis, 21, 689–690. http://access.bl.uk/ark:/81055/vdc_100040770506.0x00004c