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Estivill, R. et al. (n.d.). A Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS. Microscopy and microanalysis. pp. 689-690. [Online].
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Estivill, R. et al. (n.d.). A Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS. Microscopy and microanalysis. pp. 689-690. [Online].