Evaluation and modeling of adhesion layer in shock-protection structure for MEMS accelerometer. (November 2016)
- Record Type:
- Journal Article
- Title:
- Evaluation and modeling of adhesion layer in shock-protection structure for MEMS accelerometer. (November 2016)
- Main Title:
- Evaluation and modeling of adhesion layer in shock-protection structure for MEMS accelerometer
- Authors:
- Yamane, Daisuke
Konishi, Toshifumi
Safu, Teruaki
Toshiyoshi, Hiroshi
Sone, Masato
Masu, Kazuya
Machida, Katsuyuki - Abstract:
- Abstract: This paper presents evaluation and modeling of adhesion layer in shock-protection structure for a MEMS accelerometer fabricated by the multi-layer metal technology. The shock-protection structure is used to limit the proof-mass displacement at the input of excess acceleration. To clarify the mechanical characteristics of the shock-protection structure, we investigate the relationship between the input acceleration and the adhesion force on the adhesion layer in the multi-layer metal structure. For the multi-physics simulation, we propose an equivalent circuit model for a shock-protection module combined with the acceleration module. The adhesion force on the adhesion layer is examined by tensile tests in order to obtain the simulation parameters. The multi-physics simulation results are consistent with the measured capacitance-acceleration characteristics. The transient and capacitance-acceleration simulations at the input of high acceleration are also demonstrated to show the non-linear behavior of the shock-protection structure. Therefore, it is confirmed that the proposed module is useful for the multi-physics simulation to analyze the shock tolerance. Highlights: An equivalent circuit model of a shock-protection structure module is proposed. The module is implemented in a multi-physics simulation platform. Multi-physics simulation results are consistent with measurement data. Transient and C-G simulations with high input acceleration are demonstrated. TheAbstract: This paper presents evaluation and modeling of adhesion layer in shock-protection structure for a MEMS accelerometer fabricated by the multi-layer metal technology. The shock-protection structure is used to limit the proof-mass displacement at the input of excess acceleration. To clarify the mechanical characteristics of the shock-protection structure, we investigate the relationship between the input acceleration and the adhesion force on the adhesion layer in the multi-layer metal structure. For the multi-physics simulation, we propose an equivalent circuit model for a shock-protection module combined with the acceleration module. The adhesion force on the adhesion layer is examined by tensile tests in order to obtain the simulation parameters. The multi-physics simulation results are consistent with the measured capacitance-acceleration characteristics. The transient and capacitance-acceleration simulations at the input of high acceleration are also demonstrated to show the non-linear behavior of the shock-protection structure. Therefore, it is confirmed that the proposed module is useful for the multi-physics simulation to analyze the shock tolerance. Highlights: An equivalent circuit model of a shock-protection structure module is proposed. The module is implemented in a multi-physics simulation platform. Multi-physics simulation results are consistent with measurement data. Transient and C-G simulations with high input acceleration are demonstrated. The module is useful to analyze the shock tolerance of MEMS accelerometer. … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 66(2016)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 66(2016)
- Issue Display:
- Volume 66, Issue 2016 (2016)
- Year:
- 2016
- Volume:
- 66
- Issue:
- 2016
- Issue Sort Value:
- 2016-0066-2016-0000
- Page Start:
- 78
- Page End:
- 84
- Publication Date:
- 2016-11
- Subjects:
- Shock-protection -- MEMS -- Accelerometer -- Multi-layer metal -- Multi-physics simulation
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2016.09.018 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 7383.xml