Cite
MLA Citation
M.A. Villena et al.. “An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs.” Solid-state electronics, vol. 111, 2015, pp. 47–51. http://access.bl.uk/ark:/81055/vdc_100040821668.0x00005d
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M.A. Villena et al.. “An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs.” Solid-state electronics, vol. 111, 2015, pp. 47–51. http://access.bl.uk/ark:/81055/vdc_100040821668.0x00005d