Cite
HARVARD Citation
Besnard, G. et al. (2015). Superior performance and Hot Carrier reliability of strained FDSOI nMOSFETs for advanced CMOS technology nodes. Solid-state electronics. pp. 127-131. [Online].
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Besnard, G. et al. (2015). Superior performance and Hot Carrier reliability of strained FDSOI nMOSFETs for advanced CMOS technology nodes. Solid-state electronics. pp. 127-131. [Online].