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APA Citation
Bühler, R., Agopian, P., Collaert, N., Simoen, E., Claeys, C., & Martino, J. (2015). different stress techniques and their efficiency on triple-gate SOI n-MOSFETs. Solid-state electronics, 103, 209–215. http://access.bl.uk/ark:/81055/vdc_100031414775.0x000060