An integrated high-performance ratio-metric wavelength measurement device on glass. (24th August 2015)

• Record Type: Journal Article
• Authors: Wang, Gencheng; Yang, Bing; Shen, Ao; Pei, Chongyang; Yang, Longzhi; Yu, Hui; Jiang, Xiaoqing; Li, Yubo; Hao, Yinlei; Yang, Jianyi
• Is Part Of: Journal of optics. Volume 17:Number 10(2015:Oct.)
• Publication Date: 2015-08-24
• Subjects: Mach–Zehnder interferometer -- ratio-metric wavelength monitor -- ion-exchange -- x-type spectral response -- integrated optics; Optics -- Periodicals; 535.05
• DOI: 10.1088/2040-8978/17/10/105802
• Languages: English
• ISSNs: 2040-8978

Abstract

Abstract: The measurable wavelength range and the resolution of the ratio-metric wavelength monitor are limited by each other in a conventional structure. To solve this problem we designed and fabricated a high-performance integrated double ratio-metric wavelength measurement device on glass by the method of ion-exchange. It consists of four unbalanced Mach–Zehnder interferometers (MZIs) to form a rough wavelength measurement with a wide range and a fine wavelength measurement with high resolution. The highest measured resolution can reach 10 pm in a 1.6 nm-wide wavelength range for the fine wavelength measurement together with a 45 nm-wide wavelength range for the rough measurement. By heating the unbalanced MZI, the performance of the fine wavelength monitor can be improved.