An integrated high-performance ratio-metric wavelength measurement device on glass. (24th August 2015) - Wang, Gencheng
Abstract: The measurable wavelength range and the resolution of the ratio-metric wavelength monitor are limited by each other in a conventional structure. To solve this problem we designed and fabricated a high-performance integrated double ratio-metric wavelength measurement device on glass by the method of ion-exchange. It consists of four unbalanced Mach–Zehnder interferometers (MZIs) to form a rough wavelength measurement with a wide range and a fine wavelength measurement with high resolution. The highest measured resolution can reach 10 pm in a 1.6 nm-wide wavelength range for the fine wavelength measurement together with a 45 nm-wide wavelength range for the rough measurement. By heating the unbalanced MZI, the performance of the fine wavelength monitor can be improved.