Cite
MLA Citation
O.T. Ng et al.. “Reduction in EMI with BaTiO3 and Fe3O4 Thin Film grown by UBM Sputtering.” Procedia engineering, vol. 216, 2018, pp. 111–126. http://access.bl.uk/ark:/81055/vdc_100066409567.0x00000f
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O.T. Ng et al.. “Reduction in EMI with BaTiO3 and Fe3O4 Thin Film grown by UBM Sputtering.” Procedia engineering, vol. 216, 2018, pp. 111–126. http://access.bl.uk/ark:/81055/vdc_100066409567.0x00000f