Cite
HARVARD Citation
Ng, O. et al. (2018). Reduction in EMI with BaTiO3 and Fe3O4 Thin Film grown by UBM Sputtering. Procedia engineering. pp. 111-126. [Online].
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Ng, O. et al. (2018). Reduction in EMI with BaTiO3 and Fe3O4 Thin Film grown by UBM Sputtering. Procedia engineering. pp. 111-126. [Online].