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APA Citation
Nowakowski, P., Ubhi, H. S., & Mathieu, S. (2015). investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction. IOP conference series, 82(1), . http://access.bl.uk/ark:/81055/vdc_100051900915.0x000001