Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode. (June 2018)
- Record Type:
- Journal Article
- Title:
- Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode. (June 2018)
- Main Title:
- Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode
- Authors:
- Hylský, Josef
Strachala, Dávid
Vyroubal, Petr
Čudek, Pavel
Vaněk, Jiří
Vanýsek, Petr - Abstract:
- Abstract: This paper deals with Potential Induced Degradation (PID) of p -type monocrystalline PV modules (Evergreen) from a photovoltaic power plant that has been in operation mode for 7 years. Within the PV module affected by the PID degradation, the effect of the electric field on individual PV cells is studied. The distribution of the electric field was simulated by SolidWorks software. The results show a random distribution of affected PV cells not related to the size and distribution of the electric field intensity. Furthermore, the dependencies of negative voltage potential on the range of PID degradation of individual PV modules located in the negative pole of the PV string is made. From measured current voltage characteristics (measured at STC), it is evident that the value of negative voltage potential is not directly proportional to the PID occurrence. These results are supplemented by electroluminescence images which confirm this finding. Highlights: The PID affection of PV cells isn't proportional on the el. field intensity distribution but on the PV cell susceptibility. The claim that the most affected PID modules are at the highest negative potential in the PV plant string is wrong. The extent of PID in the negative part of string is random and PV modules performance cannot be predicted in advance. It is not possible to precisely determine the magnitude of the negative voltage required to initiate the PID.
- Is Part Of:
- Microelectronics and reliability. Volume 85(2018)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 85(2018)
- Issue Display:
- Volume 85, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 85
- Issue:
- 2018
- Issue Sort Value:
- 2018-0085-2018-0000
- Page Start:
- 12
- Page End:
- 18
- Publication Date:
- 2018-06
- Subjects:
- Potential induced degradation -- Negative voltage potential -- Photovoltaic power plant -- SolidWorks simulation -- Photovoltaic modules
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2018.04.003 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 6726.xml