Cite
APA Citation
Donarelli, M., Perrozzi, F., Bisti, F., Paparella, F., Feyer, V., Ponzoni, A., Gonchigsuren, M., & Ottaviano, L. (2015). few layered MoS2 lithography with an AFM tip: description of the technique and nanospectroscopy investigations. Nanoscale, 7(26), 11453–11459. http://access.bl.uk/ark:/81055/vdc_100064367355.0x000001