Cite
APA Citation
Carta, D., Guttmann, P., Regoutz, A., Khiat, A., Serb, A., Gupta, I., Mehonic, A., Buckwell, M., Hudziak, S., Kenyon, A. J., & Prodromakis, T. (2016). x-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices. Nanotechnology, 27, . http://access.bl.uk/ark:/81055/vdc_100061913936.0x000008