Wafer-scale fabrication of self-actuated piezoelectric nanoelectromechanical resonators based on lead zirconate titanate (PZT). (30th January 2015)

• Record Type: Journal Article
• Authors: Dezest, D; Thomas, O; Mathieu, F; Mazenq, L; Soyer, C; Costecalde, J; Remiens, D; Deü, J F; Nicu, L
• Is Part Of: Journal of micromechanics and microengineering. Volume 25:Number 3(2015:Mar.)
• Publication Date: 2015-01-30
• Subjects: NEMS -- PZT -- large-scale integration; Microelectromechanical systems -- Periodicals; Micromechanics -- Periodicals; 621.38105
• DOI: 10.1088/0960-1317/25/3/035002
• Languages: English
• ISSNs: 0960-1317

Abstract

Abstract: In this paper we report an unprecedented level of integration of self-actuated nanoelectromechanical system (NEMS) resonators based on a 150 nm thick lead zirconate titanate (PZT) thin film at the wafer-scale. A top-down approach combining ultraviolet (UV) lithography with other standard planar processing technologies allows us to achieve high-throughput manufacturing. Multilayer stack cantilevers with different geometries have been implemented with measured fundamental resonant frequencies in the megahertz range and Q-factor values ranging from ~130 in air up to ~900 in a vacuum at room temperature. A refined finite element model taking into account the exact configuration of the piezoelectric stack is proposed and demonstrates the importance of considering the dependence of the beam' s cross-section upon the axial coordinate. We extensively investigate both experimentally and theoretically the transduction efficiency of the implemented piezoelectric layer and report for the first time at this integration level a piezoelectric constant of fm V −1 . Finally, we discuss the current limitations to achieve piezoelectric detection.