Adhesion measurement of micropatterned surfaces using three-dimensional-printed atomic force microscopy tips. (1st June 2017)

• Record Type: Journal Article
• Authors: Hung, Chih-Yi; Yeh, Yun-Peng; Sung, Cheng-Kuo; Liao, Wei-Chien; Chuang, Tzu-Han; Fu, Chien-Chung
• Is Part Of: Japanese journal of applied physics. Volume 56:Number 6(2017)Supplement 1
• Publication Date: 2017-06-01
• Subjects: Physics -- Periodicals; 621.05
• DOI: 10.7567/JJAP.56.06GK04
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: The aim of the present work is to fabricate three-dimensional-printed (3D-printed) atomic force microscopy (AFM) tips for the measurement of the adhesion force on micropatterned surfaces. The shape of the microstructure strongly affects the peeling-off process in the fabrication of flexible electronic devices, and we demonstrate the fabrication of a micropatterned structure for the peeling-off process from soft materials. Furthermore, the 3D-printed AFM tips not only have an optimized design but also increase the sensitivity of adhesion force measurement. We have demonstrated the conical 3D-printed AFM tips with the radii of the spherical end from 2 to 10 µm with various sensitivities of adhesive force measurement.