Adhesion measurement of micropatterned surfaces using three-dimensional-printed atomic force microscopy tips. (1st June 2017) - Hung, Chih-Yi
Abstract: The aim of the present work is to fabricate three-dimensional-printed (3D-printed) atomic force microscopy (AFM) tips for the measurement of the adhesion force on micropatterned surfaces. The shape of the microstructure strongly affects the peeling-off process in the fabrication of flexible electronic devices, and we demonstrate the fabrication of a micropatterned structure for the peeling-off process from soft materials. Furthermore, the 3D-printed AFM tips not only have an optimized design but also increase the sensitivity of adhesion force measurement. We have demonstrated the conical 3D-printed AFM tips with the radii of the spherical end from 2 to 10 µm with various sensitivities of adhesive force measurement.