Cite
HARVARD Citation
Benka, T. et al. (n.d.). Characterization of pixel sensor designed in 180 nm SOI CMOS technology. Journal of instrumentation. p. C01025. [Online].
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Benka, T. et al. (n.d.). Characterization of pixel sensor designed in 180 nm SOI CMOS technology. Journal of instrumentation. p. C01025. [Online].