Characterization of pixel sensor designed in 180 nm SOI CMOS technology. (19th January 2018)

Record Type:: Journal Article
Title:: Characterization of pixel sensor designed in 180 nm SOI CMOS technology. (19th January 2018)
Main Title:: Characterization of pixel sensor designed in 180 nm SOI CMOS technology
Authors:: Benka, T.
Havranek, M.
Hejtmanek, M.
Jakovenko, J.
Janoska, Z.
Marcisovska, M.
Marcisovsky, M.
Neue, G.
Tomasek, L.
Vrba, V.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 13:Number 1(2018:Jan.)
Journal:: Journal of instrumentation
Issue:: Volume 13:Number 1(2018:Jan.)
Issue Display:: Volume 13, Issue 1 (2018)
Year:: 2018
Volume:: 13
Issue:: 1
Issue Sort Value:: 2018-0013-0001-0000
Page Start:: C01025
Page End:: C01025
Publication Date:: 2018-01-19
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/13/01/C01025 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 6394.xml