Cite
MLA Citation
Michael Doutre et al.. “Fine Pore Structure Characterization in Two Gessoes Using Focused Ion Bean Scanning.” MRS proceedings, no. 1656, 2014, p. . http://access.bl.uk/ark:/81055/vdc_100030688852.0x000017
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Michael Doutre et al.. “Fine Pore Structure Characterization in Two Gessoes Using Focused Ion Bean Scanning.” MRS proceedings, no. 1656, 2014, p. . http://access.bl.uk/ark:/81055/vdc_100030688852.0x000017