Crosstalk noise modeling of multiwall carbon nanotube (MWCNT) interconnects using finite-difference time-domain (FDTD) technique. Issue 1 (January 2015)

• Record Type: Journal Article
• Authors: Ramesh Kumar, Vobulapuram; Kaushik, Brajesh Kumar; Patnaik, Amalendu
• Is Part Of: Microelectronics and reliability. Volume 55:Issue 1(2015)
• Page Start: 155
• Page End: 163
• Publication Date: 2015-01
• Subjects: Coupled MWCNT lines -- Crosstalk -- FDTD -- Transient analysis; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2014.09.001
• Languages: English
• ISSNs: 0026-2714

Abstract

Highlights: This paper presents a FDTD model for crosstalk analysis of MWCNT interconnects. The model can be extended to coupled- n lines with a low computational cost. The proposed model is validated with industry standard HSPICE simulations. In driver–interconnect–load structure, resistive driver is used for simplicity. Abstract: This paper presents an accurate and efficient model for the transient analysis of multiwall carbon nanotubes (MWCNT) using finite-difference time-domain (FDTD) method. The proposed model can be essentially used to analyze the functional and dynamic crosstalk effects of coupled-two MWCNT interconnect lines. Using the proposed model the voltage and current can be accurately estimated at any point on the interconnect line and furthermore, the model can be extended to coupled- n interconnect lines with a low computational cost. Crosstalk induced propagation delay, peak voltage, and its timing instance are measured using the proposed model and validated by comparing it to the HSPICE simulations. Over a random number of test cases it is observed that the average error in estimating the noise peak voltage on a victim line is less than 1%. The proposed model is extremely useful for accurate estimation of crosstalk induced performance parameters of MWCNT interconnects.