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APA Citation
Kwek, J. W., Siliveru, K., Cheng, S., Xu, Q., & Ambrose, R. K. (2018). zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour. Journal of cereal science, 79, 66–72. http://access.bl.uk/ark:/81055/vdc_100056818429.0x00001c