Cite
HARVARD Citation
Kwek, J. et al. (2018). Zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour. Journal of cereal science. pp. 66-72. [Online].
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Kwek, J. et al. (2018). Zein film functionalized atomic force microscopy and Raman spectroscopic evaluations on surface differences between hard and soft wheat flour. Journal of cereal science. pp. 66-72. [Online].